Microelectronics failure analysis : desk reference /

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Détails bibliographiques
Cote:Libro Electrónico
Collectivités auteurs: ASM International, Electronic Device Failure Analysis Society
Autres auteurs: Ross, Richard J.
Format: Électronique eBook
Langue:Inglés
Publié: Materials Park, Ohio : ASM International, ©2011.
Édition:6th ed.
Sujets:
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Defects > Testing > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Electronics > Materials > Testing > Handbooks, manuals, etc.
Electronics > Materials > Defects > Handbooks, manuals, etc.
Electronics > Materials > Handbooks, manuals, etc.
Appareils électroniques > Essais > Guides, manuels, etc.
Électronique > Matériaux > Guides, manuels, etc.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
Electronic apparatus and appliances > Testing
Electronics > Materials > Defects
Electronics > Materials > Testing
Microelectronics > Materials > Testing
Handbook
handbooks.
Handbooks and manuals
Handbooks and manuals.
Guides et manuels.
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