International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, & Electronic Device Failure Analysis Society. (2010). ISTFA 2010: Conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. ASM International.
Style de citation Chicago (17e éd.)International Symposium for Testing and Failure Analysis Dallas, Tex., ASM International, et Electronic Device Failure Analysis Society. ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. Materials Park, Ohio: ASM International, 2010.
Style de citation MLA (8e éd.)International Symposium for Testing and Failure Analysis Dallas, Tex., et al. ISTFA 2010: Conference Proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA. ASM International, 2010.