Johnston, A. (2010). Reliability and radiation effects in compound semiconductors. World Scientific.
Cita Chicago Style (17a ed.)Johnston, Allan. Reliability and Radiation Effects in Compound Semiconductors. Singapore ; Hackensack, NJ: World Scientific, 2010.
Cita MLA (8a ed.)Johnston, Allan. Reliability and Radiation Effects in Compound Semiconductors. World Scientific, 2010.
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