Cargando…

Value analysis tear-down : a new process for product development and innovation /

"Value Analysis Tear-Down presents a new technology, first developed in Japan by Yoshihiko Sato, for improving existing products and creating new and better products. It combines traditional tear-down with the technologies of value analysis and value engineering." "This book is writte...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Sato, Yoshihiko
Otros Autores: Kaufman, J. Jerry
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York : Industrial Press : Society of Manufacturing Engineers, 2005.
Edición:1st ed.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Ch. 1. VA tear-down : what it is, how it developed
  • Ch. 2. Value analysis and VA tear-down
  • Ch. 3. The VA tear-down process
  • Ch. 4. Applying VA tear-down to issues of concern
  • Ch. 5. Evaluating VA tear-down results
  • Ch. 6. Other measures of competitiveness with VA tear-down.