Value analysis tear-down : a new process for product development and innovation /
"Value Analysis Tear-Down presents a new technology, first developed in Japan by Yoshihiko Sato, for improving existing products and creating new and better products. It combines traditional tear-down with the technologies of value analysis and value engineering." "This book is writte...
Clasificación: | Libro Electrónico |
---|---|
Autor principal: | Sato, Yoshihiko |
Otros Autores: | Kaufman, J. Jerry |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
New York :
Industrial Press : Society of Manufacturing Engineers,
2005.
|
Edición: | 1st ed. |
Temas: | |
Acceso en línea: | Texto completo |
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