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Value analysis tear-down : a new process for product development and innovation /

"Value Analysis Tear-Down presents a new technology, first developed in Japan by Yoshihiko Sato, for improving existing products and creating new and better products. It combines traditional tear-down with the technologies of value analysis and value engineering." "This book is writte...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Sato, Yoshihiko
Otros Autores: Kaufman, J. Jerry
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York : Industrial Press : Society of Manufacturing Engineers, 2005.
Edición:1st ed.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:"Value Analysis Tear-Down presents a new technology, first developed in Japan by Yoshihiko Sato, for improving existing products and creating new and better products. It combines traditional tear-down with the technologies of value analysis and value engineering." "This book is written specifically for professionals in product engineering, manufacturing engineering, and value engineering; and the managers of these professionals, including plant managers, production managers, manufacturing executives, and research and development executives. It is applicable to many other industries besides manufacturing, including those in the service sector."--Jacket.
Descripción Física:1 online resource (x, 206 pages) : illustrations
Bibliografía:Includes bibliographical references (page 199) and index.
ISBN:9781615835799
1615835792
9780831132033
0831132035