Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /

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Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process en...

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Bibliographic Details
Call Number:Libro Electrónico
Other Authors: Bowen, W. Richard, Hilal, Nidal
Format: Electronic eBook
Language:Inglés
Published: Oxford ; Burlington, MA : Butterworth-Heinemann, ©2009.
Edition:1st ed.
Series:Butterworth-Heinemann/IChemE series.
Subjects:
Atomic force microscopy.
Production engineering.
Microscopie à force atomique.
Technique de la production.
TECHNOLOGY & ENGINEERING > Nanotechnology & MEMS.
Online Access:Texto completo
Table of Contents:
  • BASIC PRINCIPLES OF ATOMIC FORCE MICROSCOPY / W Richard Bowen, Nidal Hilal and Daniel Johnson
  • CHARACTERISATION OF MEMBRANE SURFACES / W Richard Bowen, Nidal Hilal and Teodora Doneva
  • AFM AND DEVELOPMENT OF (BIO)FOULING RESISTANT MEMBRANES / W Richard Bowen, Nidal Hilal, Huabing Yin and Laila Al-Khatib
  • APPLICATION OF ATOMIC FORCE MICROSCOPY TO PARTICLE-PARTICLE INTERACTIONS / Nidal Hilal, Yuncheng Liang and Daniel Johnson
  • QUANTIFICATION OF PARTICLE-BUBBLE INTERACTIONS / Nidal Hilal and Daniel Johnson
  • NANOSCALE ANALYSIS OF PHARMACEUTICALS BY SCANNING PROBE MICROSCOPY / Clive J Roberts
  • THE APPLICATION OF AFM WITHIN BIOPROCESS ENGINEERING / Chris J Wright
  • THE APPLICATION OF AFM TO THE DEVELOPMENT OF PROCESS PLANT MATERIALS / Chris J Wright
  • ATOMIC FORCE MICROSCOPY AND POLYMERS ON SURFACES / Vasileios Koutsos
  • AFM-BASED MICRO/NANO-RHEOMETRY / Matthew S Barrow and P Rhodri Williams
  • CONCLUSIONS AND FUTURE OUTLOOK / W Richard Bowen and Nidal Hilal.

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