Neutron and x-ray reflectometry : emerging phenomena at heterostructure interfaces /

This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.

Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Basu, Saibal (Author), Singh, Surendra (Ph. D. in physics) (Author)
Format: Electronic eBook
Language:Inglés
Published: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
Series:IOP (Series). Release 22.
IOP ebooks. 2022 collection.
Subjects:
Thin films > Optical properties.
Neutrons > Scattering.
X-rays > Scattering.
Reflection (Optics)
Atomic & molecular physics.
SCIENCE / Physics / Magnetism.
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