Chargement en cours…

Neutron and x-ray reflectometry : emerging phenomena at heterostructure interfaces /

This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.

Détails bibliographiques
Cote:Libro Electrónico
Auteurs principaux: Basu, Saibal (Auteur), Singh, Surendra (Ph. D. in physics) (Auteur)
Format: Électronique eBook
Langue:Inglés
Publié: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
Collection:IOP (Series). Release 22.
IOP ebooks. 2022 collection.
Sujets:
Accès en ligne:Texto completo