Full field optical metrology and applications /

This book introduces non-contact optical techniques based on the speckle effect in more detail.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Mendoza-Santoyo Fernando (Autor), Torre-Ibarra, Manuel de la (Autor), Hernández-Montes, María del Socorro (Autor), Flores Moreno, Jorge Mauricio (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]
Colección:IOP (Series). Release 22.
IOP series in advances in optics, photonics and optoelectronics.
IOP ebooks. 2022 collection.
Temas:
Optical measurements.
Metrology.
Optical physics.
SCIENCE / Physics / Optics & Light.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • 1. Foundations of optical interferometry
  • 1.1. Light waves
  • 1.2. Types of interferometers
  • 1.3. Interference of light waves
  • 1.4. Multiple wave interference
  • 1.5. White-light interferometry
  • 1.6. Holographic interferometry
  • 2. Coherence
  • 2.1. Introduction : the background
  • 2.2. Basic principles of coherence
  • 2.3. Temporal coherence
  • 2.4. Partial coherence
  • 2.5. Spatial coherence
  • 3. Phase retrieval
  • 3.1. Phase sampling evaluation
  • 3.2. Modern methods for phase retrieval
  • 3.3. Interference phase demodulation
  • 4. Laser speckle metrology
  • 4.1. Basics for laser speckle metrology
  • 4.2. Laser speckle measurements
  • 5. Moiré interferometry
  • 5.1. Introduction
  • 5.2. Moiré pattern formulation
  • 5.3. Moiré pattern alignment
  • 5.4. Shape detection via the moiré pattern
  • 6. Holography
  • 6.1. Digital holographic interferometry
  • 7. Digital speckle pattern interferometry (DSPI)
  • 7.1. Background
  • 7.2. DSPI technique
  • 7.3. The sensitivity vector, the displacement vector, and the optical phase difference
  • 7.4. In-plane and out-of-plane sensitive set-ups
  • 7.5. Phase-stepping interferometry
  • 7.6. Vibration modes obtained with DSPI
  • 8. 3D digital holographic interferometry
  • 8.1. Principle
  • 8.2. Illuminating once at a time
  • 8.3. Illuminating at the same time (simultaneously)
  • 8.4. Strain measurement using DHI
  • 8.5. Deformation in 3D measurements
  • 8.6. Amplitude and phase calculation for harmonic excitation with pulsed object illumination : an example
  • 9. Digital holographic microscopy for surface profilometry
  • 9.1. Introduction
  • 9.2. Digital holographic microscopy
  • 9.3. Optical phase unwrapping by multi-wavelength digital holographic microscopy
  • 9.4. Digital holography using low coherence sources
  • 10. Contouring
  • 10.1. Two points of object illumination
  • 10.2. Two-wavelength contouring
  • 10.3. Contouring from experimental data
  • 11. Optical coherence tomography
  • 11.1. OCT configurations
  • 11.2. Optical phase in spectral OCT
  • 11.3. Examples of depth-resolved phase measurement
  • 12. Digital image correlation
  • 12.1. A brief introduction to digital image correlation
  • 12.2. Two-dimensional digital image correlation
  • 12.3. Three-dimensional digital image correlation
  • 13. Speckle-noise reduction in optical techniques by non-local means methods
  • 13.1. Introduction
  • 13.2. Non-local means methods
  • 13.3. Examples
  • 14. Overview of recent applications using DHI
  • 14.1. Introduction
  • 14.2. Basic applications of DHI
  • 15. A couple of trending applications related to holography
  • 15.1. Electron holographic interferometry
  • 15.2. Quantum holography.

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