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The formation of structural imperfections in semiconductor silicon /

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Detalles Bibliográficos
Clasificación:	Libro Electrónico
Autores principales:	Talanin, V. I. (Autor), Talanin, I. E. (Autor)
Formato:	Electrónico eBook
Idioma:	Inglés
Publicado:	Newcastle-upon-Tyne, England : Cambridge Scholars Publishing, 2018.
Temas:	Silicon > Structure. Semiconductors > Impurity distribution. Semiconductors > Materials. Electronic books.
Acceso en línea:	Texto completo

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