International Conference on Advanced Micro Device Engineering & Hanaizumi, O. (2019). Means and Methods for Measurement and Monitoring: Supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan. Trans Tech Publications.
Cita Chicago Style (17a ed.)International Conference on Advanced Micro Device Engineering y Osamu Hanaizumi. Means and Methods for Measurement and Monitoring: Supplement Book to Advanced Micro-device Engineering VIII : Selected, Peer Reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan. Zurich, Switzerland: Trans Tech Publications, 2019.
Cita MLA (8a ed.)International Conference on Advanced Micro Device Engineering y Osamu Hanaizumi. Means and Methods for Measurement and Monitoring: Supplement Book to Advanced Micro-device Engineering VIII : Selected, Peer Reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan. Trans Tech Publications, 2019.