APA (7th ed.) Citation

Beyerer, J., Richter, M., & Nagel, M. (2018). Pattern recognition: Introduction, features, classifiers and principles. Walter de Gruyter GmbH.

Chicago Style (17th ed.) Citation

Beyerer, Jürgen, Matthias Richter, and Matthias Nagel. Pattern Recognition: Introduction, Features, Classifiers and Principles. Berlin ; Boston: Walter de Gruyter GmbH, 2018.

MLA (8th ed.) Citation

Beyerer, Jürgen, et al. Pattern Recognition: Introduction, Features, Classifiers and Principles. Walter de Gruyter GmbH, 2018.