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An introduction to the event-related potential technique /

An essential guide to designing, conducting, and analyzing event-related potential (ERP) experiments, completely updated for this edition.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Luck, Steven J. (Steven John), 1963- (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cambridge, Massachusetts : The MIT Press, [2014]
Edición:Second edition.
Temas:
Acceso en línea:Texto completo
Tabla de Contenidos:
  • A broad overview of the event-related potential technique
  • A closer look at ERPs and ERP components
  • Overview of common ERP components
  • The design of ERP experiments
  • Basic principles of ERP recording
  • Artifact rejection and correction
  • Basics of Fourier analysis and filtering
  • Baseline correction, averaging, and time-frequency analysis
  • Quantifying ERP amplitudes and latencies
  • Statistical analysis.