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| LEADER |
00000cam a2200000M 4500 |
| 001 |
EBSCO_ocn872684611 |
| 003 |
OCoLC |
| 005 |
20231017213018.0 |
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m o d |
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cr ||||||||||| |
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131216s2009 xx o 000 0 eng d |
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|a 1011000898
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|a 1615030921
|q (electronic bk.)
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| 020 |
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|a 9781615030927
|q (electronic bk.)
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|a AU@
|b 000066760324
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|a DEBBG
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|a DEBSZ
|b 493140883
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|a (OCoLC)872684611
|z (OCoLC)1011000898
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|a TK
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|a TEC
|x 009070
|2 bisacsh
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0 |
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|a 621.381
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| 049 |
|
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|a UAMI
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| 100 |
1 |
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|a INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (35TH: 2009: SAN JOSE, CALIF.)
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| 245 |
1 |
0 |
|a Istfa 2009 :
|b CONFERENCE PROCEEDINGS FROM THE 35TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS.
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| 260 |
|
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|a MATERIALS PARK:
|b ASM INTERNATIONAL
|c 2009.
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| 300 |
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|a 1 online resource
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| 336 |
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|a text
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|a computer
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| 338 |
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|a online resource
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|2 rdacarrier
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| 490 |
0 |
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|a ISTFA. PROCEEDINGS.
|v 2009
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| 505 |
0 |
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|a IPFA 09 Best Paper; Session 1: Emerging Concepts; Session 2: Photon Beam Based Techniques -- 1; Session 3: Nanoprobing; Session 4: Circuit-Edit; Session 5: Sample Preparation; Session 6: Alternative Energy; Session 7: Posters; Session 8: Photon Beam Based Techniques -- 2; Session 9: Package and Assembly Level FA; Session 10: Failure Analysis Process; Session 11: Advanced Metrology and System Level FA; Author Index.
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| 590 |
|
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
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| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Electronics
|x Materials
|x Testing
|v Congresses.
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| 650 |
|
6 |
|a Appareils électroniques
|x Essais
|v Congrès.
|
| 650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Mechanical.
|2 bisacsh
|
| 650 |
|
7 |
|a Electronic apparatus and appliances
|x Testing
|2 fast
|
| 650 |
|
7 |
|a Electronics
|x Materials
|x Testing
|2 fast
|
| 655 |
|
7 |
|a Conference papers and proceedings
|2 fast
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| 856 |
4 |
0 |
|u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=395916
|z Texto completo
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|b EBSC
|n 395916
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|a YBP Library Services
|b YANK
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| 994 |
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|a 92
|b IZTAP
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