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Gettering and defect engineering in semiconductor technology XIII : GADEST 2009 : proceedings of the XIIIth International Autumn Meeting, Dölnsee-Schorfheide, north of Berlin, Germany, September 26-October 02, 2009 /
This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices. The volume comprises 93 contributions; among them, 14 invited papers, from more than 20 different countries. The invited papers, subm...
| Cote: | Libro Electrónico |
|---|---|
| Collectivité auteur: | |
| Autres auteurs: | , |
| Format: | Électronique Actes de congrès eBook |
| Langue: | Inglés |
| Publié: |
Stafa-Zuerich, Switzerland :
Trans Tech Publications,
©2010.
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| Collection: | Diffusion and defect data. Solid state phenomena ;
v. 156/158. |
| Sujets: | |
| Accès en ligne: | Texto completo |