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Advanced measurement and test : selected, peer reviewed papers from the 2011 International Conference on Advanced Measurement and Test (AMT 2011), June 24-26, 2011, Nanchang, China /
This second collection on ""Advanced Measurement and Test II"" is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, sys...
| Clasificación: | Libro Electrónico |
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| Autor Corporativo: | |
| Otros Autores: | , |
| Formato: | Electrónico Congresos, conferencias eBook |
| Idioma: | Inglés |
| Publicado: |
Durnten-Zurich, Switzerland ; Enfield, NH :
Trans Tech Publication,
©2011.
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| Colección: | Advanced materials research ;
v. 301-303. |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | This second collection on ""Advanced Measurement and Test II"" is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics. Review from Book News Inc.: Three hundred and twenty-four papers from the June 2011 conference are arranged into three volumes on material science and technology, measuring and testin. |
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| Descripción Física: | 1 online resource (2 volumes) : illustrations |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 9783038136279 3038136271 |