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EBSCO_ocn811371628 |
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OCoLC |
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20231017213018.0 |
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m o d |
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120813s2012 ts a ob 001 0 eng d |
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|a 961627080
|a 962695752
|a 1081284389
|a 1086980933
|a 1153523035
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|a 9781608053599
|q (electronic bk.)
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|a 1608053598
|q (electronic bk.)
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|a (OCoLC)811371628
|z (OCoLC)961627080
|z (OCoLC)962695752
|z (OCoLC)1081284389
|z (OCoLC)1086980933
|z (OCoLC)1153523035
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050 |
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4 |
|a TK7871.85
|b .W65 2012eb
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|a TEC
|x 008010
|2 bisacsh
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|a TEC
|x 008020
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0 |
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|a 621.3815
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|a UAMI
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1 |
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|a Wong, Terence K. S.
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1 |
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|a Semiconductor strain metrology :
|b principles and applications /
|c Terence K.S. Wong.
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260 |
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|a [Saif Zone, Sharjah, U.A.E] ;
|a Oak Park, IL :
|b Bentham Science,
|c [2012]
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300 |
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|a 1 online resource (136 pages) :
|b illustrations
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a data file
|2 rda
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|a Includes bibliographical references and index.
|
590 |
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|a eBooks on EBSCOhost
|b EBSCO eBook Subscription Academic Collection - Worldwide
|
650 |
|
0 |
|a Semiconductors
|x Design and construction
|x Materials.
|
650 |
|
0 |
|a Compound semiconductors
|x Design and construction
|x Materials.
|
650 |
|
0 |
|a Silicon-on-insulator technology.
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650 |
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|a Silicium sur isolant.
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650 |
|
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|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Circuits
|x General.
|2 bisacsh
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650 |
|
7 |
|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Circuits
|x Integrated.
|2 bisacsh
|
650 |
|
7 |
|a Silicon-on-insulator technology.
|2 fast
|0 (OCoLC)fst01118704
|
856 |
4 |
0 |
|u https://ebsco.uam.elogim.com/login.aspx?direct=true&scope=site&db=nlebk&AN=500610
|z Texto completo
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938 |
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|a ebrary
|b EBRY
|n ebr10570978
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|a EBSCOhost
|b EBSC
|n 500610
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994 |
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|a 92
|b IZTAP
|