Cita APA (7a ed.)

ASM International, Electronic Device Failure Analysis Society, & Ross, R. J. (2011). Microelectronics failure analysis: Desk reference (6th ed.). ASM International.

Cita Chicago Style (17a ed.)

ASM International, Electronic Device Failure Analysis Society, y Richard J. Ross. Microelectronics Failure Analysis: Desk Reference. 6th ed. Materials Park, Ohio: ASM International, 2011.

Cita MLA (8a ed.)

ASM International, et al. Microelectronics Failure Analysis: Desk Reference. 6th ed. ASM International, 2011.

Precaución: Estas citas no son 100% exactas.