ASM International, Electronic Device Failure Analysis Society, & Ross, R. J. (2011). Microelectronics failure analysis: Desk reference (6th ed.). ASM International.
Cita Chicago Style (17a ed.)ASM International, Electronic Device Failure Analysis Society, y Richard J. Ross. Microelectronics Failure Analysis: Desk Reference. 6th ed. Materials Park, Ohio: ASM International, 2011.
Cita MLA (8a ed.)ASM International, et al. Microelectronics Failure Analysis: Desk Reference. 6th ed. ASM International, 2011.
Precaución: Estas citas no son 100% exactas.