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This unique volume assembles the author's scientific and engineering achievements of the past three decades in the areas of semiconductor physics and materials, including topics in deep level defects and band structures, CMOS devices, including the topics in device technology, CMOS device relia...

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Bibliographic Details
Call Number:Libro Electrónico
Main Author: Li, Ming-Fu
Format: Electronic eBook
Language:Inglés
Published: London : Singapore ; Hackensack, NJ, Imperial College Press ; ©2011.
Subjects:
Semiconductors > Research.
Nanoelectronics > Research.
Semi-conducteurs > Recherche.
Nanoélectronique > Recherche.
TECHNOLOGY & ENGINEERING > Electronics > Semiconductors.
TECHNOLOGY & ENGINEERING > Electronics > Solid State.
Semiconductors > Research
Online Access:Texto completo
Table of Contents:
  • Preface; Contents; Introduction; Chapter 1. Defects in Semiconductors; Chapter 2. Semiconductor Band Structures; Chapter 3. Analog Integrated Circuit Design; Chapter 4. CMOS Device Reliability; Chapter 5. CMOS Technology; Chapter 6. Nano CMOS Device Quantum Simulation; Complete List of Publications; Biography

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