Chargement en cours…
Introduction to scanning tunneling microscopy /
| Cote: | Libro Electrónico |
|---|---|
| Auteur principal: | |
| Format: | Électronique eBook |
| Langue: | Inglés |
| Publié: |
New York :
Oxford University Press,
1993.
|
| Collection: | Oxford series in optical and imaging sciences ;
4. |
| Sujets: | |
| Accès en ligne: | Texto completo |
Table des matières:
- 1. Overview. 1.1. The scanning tunneling microscope in a nutshell. 1.2. Tunneling: an elementary model. 1.3. Probing electronic structure at an atomic scale. 1.4. Spatially resolved tunneling spectroscopy. 1.5. Lateral resolution: Early theories. 1.6. Origin of atomic resolution in STM. 1.7. Tip-sample interaction effects. 1.8. Historical remarks
- 2. Atom-scale tunneling. 2.2. The perturbation approach. 2.3. The image force. 2.4. The Square-barrier problem. 2.5. The modified Bardeen approach. 2.6. Effect of image force on tunneling
- 3. Tunneling matrix elements. 3.2. Tip wavefunctions. 3.3. Green's function and tip wavefunctions. 3.4. The derivative rule: individual cases. 3.5. The derivative rule: general case. 3.6. An intuitive interpretation
- 4. Wavefunctions at surfaces. 4.1. Types of surface wavefunctions. 4.2. The jellium model. 4.3. Concept of surface states. 4.4. Field emission spectroscopy. 4.5. Photoemission studies. 4.6. Atom-beam diffraction.