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|a Modern statistical and mathematical methods in reliability /
|c editors, Alyson Wilson [and others].
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|a Singapore ;
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|a Series in quality, reliability & engineering statistics ;
|v v. 10
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|a Includes bibliographical references.
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|a Print version record.
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|a Preface; CONTENTS; 1 Competing Risk Modeling in Reliability Tim Bedford; 2 Game-Theoretic and Reliability Methods in Counter-Terrorism and Security Vicki Bier; 3 Regression Models for Reliability Given the Usage Accumulation History Thierry Duchesne; 4 Bayesian Methods for Assessing System Reliability: Models and Computation Todd Graves and Michael Hamada; 5 Dynamic Modeling in Reliability and Survival Analysis Edsel A . Pena and Elizabeth H . Slate; 6 End of Life Analysis H . Wynn. T . Figarella. A . Di Bucchianico. M . Jansen. W . Bergsma.
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|a 7 Reliability Analysis of a Dynamic Phased Mission System: Comparison of Two Approaches Marc: Bouissou. Yves Dutuit. Sidoine Maillard8 Sensitivity Analysis of Accelerated Life Tests with Competing Failure Modes Cornel Bunea and Thomas A . Mazzuchi; 9 Estimating Mean Cumulative Functions From Truncated Automotive Warranty Data S . Chukova and J . Robinson; 10 Tests for Some Statistical Hypotheses for Dependent Isha Dewan and J . V . Deshpande Competing Risk.
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|a This volume contains extended versions of 28 carefully selected and reviewed papers presented at The Fourth International Conference on Mathematical Methods in Reliability in Santa Fe, New Mexico, June 21-25, 2004, the leading conference in reliability research. The meeting serves as a forum for discussing fundamental issues on mathematical methods in reliability theory and its applications. A broad overview of current research activities in reliability theory and its applications is provided with coverage on reliability modeling, network and system reliability, Bayesian methods, survival anal.
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|a English.
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|b EBSCO eBook Subscription Academic Collection - Worldwide
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|a Wilson, Alyson G.,
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|i Print version:
|t Modern statistical and mathematical methods in reliability.
|d Singapore ; Hackensack, NJ : World Scientific, ©2005
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