Characterization of high Tc materials and devices by electron microscopy /

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This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron micros...

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Détails bibliographiques
Cote:Libro Electrónico
Autres auteurs: Browning, Nigel D., Pennycook, Stephen J.
Format: Électronique eBook
Langue:Inglés
Publié: Cambridge ; New York : Cambridge University Press, 2000.
Sujets:
High temperature superconductors.
Electron microscopy > Technique.
Supraconducteurs à hautes températures.
Microscopie électronique > Technique.
TECHNOLOGY & ENGINEERING > Superconductors & Superconductivity.
Elektronenmikroskopie
Hochtemperatursupraleiter
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