Principles of semiconductor network testing /

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This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...

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Détails bibliographiques
Cote:Libro Electrónico
Auteur principal: Afshar, Amir
Format: Électronique eBook
Langue:Inglés
Publié: Boston : Butterworth-Heinemann, ©1995.
©1995
Sujets:
Integrated circuits > Testing.
Semiconductors > Testing.
Semi-conducteurs > Essais.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Integrated circuits > Testing
Semiconductors > Testing
Accès en ligne:Texto completo
Table des matières:
  • Front Cover; Principles of Semiconductor Network Testing; Copyright Page; Contents; Foreword; Preface; Chapter 1. Diode and Transistor Operation; Chapter 2. Integrated Circuit Test Basics; Chapter 3. Digital Logic Test; Chapter 4. Noise Identification; Chapter 5. Operational Amplifier; Chapter 6. Data Acquisition Devices; Chapter 7. Digital Signal Processing; Chapter 8. CODEC (Coder/Decoder); Index.

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