Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presen...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Servín, Manuel (Author), Quiroga, J. Antonio (Juan Antonio) (Author), Padilla, J. Moisés (José Moisés) (Author)
Format: Electronic eBook
Language:Inglés
Published: Weinheim : Wiley-VCH, [2014]
Edition:First edition.
Subjects:
Interferometry.
Diffraction patterns.
Optical measurements.
Interferometry
Interférométrie.
Figures de diffraction.
Mesures optiques.
SCIENCE > Energy.
SCIENCE > Mechanics > General.
SCIENCE > Physics > General.
Diffraction patterns
Optical measurements
Interferometrie
Beugungsfigur
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