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Fringe pattern analysis for optical metrology : theory, algorithms, and applications /
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presen...
| Clasificación: | Libro Electrónico |
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| Autores principales: | , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Weinheim :
Wiley-VCH,
[2014]
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| Edición: | First edition. |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such. |
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| Notas: | Edition statement from running title area. |
| Descripción Física: | 1 online resource (xvi, 328 pages) : illustrations |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 1306840880 9781306840880 9783527681082 3527681086 3527411526 9783527411528 9783527681105 3527681108 |