Cita APA (7a ed.)

Yablon, D. G. (2014). Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley.

Cita Chicago Style (17a ed.)

Yablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Hoboken, New Jersey: Wiley, 2014.

Cita MLA (8a ed.)

Yablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley, 2014.