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Surface Analysis Methods in Materials Science /
This comprehensive and up-to-date guide to the use of surface analysis methods in materials science consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing fourteen surface methods and a separate section on applications...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Berlin ; New York :
Springer-Verlag,
1992.
|
| Colección: | Springer series in surface sciences ;
23. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Surface Analysis Methods in Materials Science / |c edited by D. John O'Connor, Brett A. Sexton, Roger St. C. Smart. |
| 260 | |a Berlin ; |a New York : |b Springer-Verlag, |c 1992. | ||
| 300 | |a 1 online resource (xxi, 453 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Springer Series in Surface Sciences, |x 0931-5195 ; |v 23 | |
| 520 | |a This comprehensive and up-to-date guide to the use of surface analysis methods in materials science consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing fourteen surface methods and a separate section on applications. Each chapter is written by a specialist in the field. The surface methods described include SAM, XPS, SIMS and other ion beam methods, LEED/RHEED, RBS and NRA, FTIR, SEM, STM, UPS and magnetic methods. Among the areas of application discussed are adsorption, catalysis, coated steel surfaces, inorganic surfaces, semiconductor devices, thin film solar cells and high temperature oxidation. This detailed exposition will enable researchers to select and exploit the appropriate surface method for a given application. | ||
| 505 | 0 | |a 1. Solid Surfaces, Their Structure and Composition -- 2. UHV Basics -- 3. Electron Microscope Techniques for Surface Characterization -- 4. Sputter Depth Profiling -- 5. SIMS -- Secondary Ion Mass Spectrometry -- 6. Auger Spectroscopy and Scanning Auger Microscopy -- 7. X-Ray Photoelectron Spectroscopy -- 8. Fourier Transform Infrared Specroscopy of Surfaces -- 9. Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis -- 10. Scanning Tunnelling Microscopy -- 11. Low Energy Ion Scattering -- 12. Reflection High Energy Electron Diffraction -- 13. Low Energy Electron Diffraction -- 14. Ultraviolet Photoelectron Spectroscopy of Solids -- 15. Spin Polarized Electron Techniques -- 16. Materials Technology -- 17. Characterization of Catalysts by Surface Analysis -- 18. Applications to Devices and Device Materials -- 19. Characterization of Oxidized Surfaces -- 20. Coated Steel -- 21. Thin Film Analysis -- 22. Identification of Adsorbed Species -- IV Appendix -- Acronyms Used in Surface and Thin Film Analysis -- Surface Science Bibliography. | |
| 504 | |a Includes bibliographical references (pages 439-445) and index. | ||
| 506 | |3 Use copy |f Restrictions unspecified |2 star |5 MiAaHDL | ||
| 533 | |a Electronic reproduction. |b [S.l.] : |c HathiTrust Digital Library, |d 2010. |5 MiAaHDL | ||
| 538 | |a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. |u http://purl.oclc.org/DLF/benchrepro0212 |5 MiAaHDL | ||
| 583 | 1 | |a digitized |c 2010 |h HathiTrust Digital Library |l committed to preserve |2 pda |5 MiAaHDL | |
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Surfaces (Physics) | |
| 650 | 0 | |a Surfaces (Technology) |x Analysis. | |
| 650 | 6 | |a Surfaces (Technologie) |x Analyse. | |
| 650 | 6 | |a Surfaces (Physique) | |
| 650 | 7 | |a Surfaces (Technology) |x Analysis |2 fast | |
| 650 | 7 | |a Surfaces (Physics) |2 fast | |
| 650 | 7 | |a Oberflächenanalyse |2 gnd | |
| 700 | 1 | |a O'Connor, D. J. |q (D. John), |d 1952- |1 https://id.oclc.org/worldcat/entity/E39PCjC73Yvc4D8kGV9qHyB44m | |
| 700 | 1 | |a Smart, R. St. C. |q (Roger St. C.), |d 1944- |1 https://id.oclc.org/worldcat/entity/E39PCjBvWXJQPKHTTqHtCPqTQC | |
| 700 | 1 | |a Sexton, B. A. |q (Brett A.), |d 1950- |1 https://id.oclc.org/worldcat/entity/E39PCjGgBc3TXyBpxkRbqwmYWC | |
| 758 | |i has work: |a Surface analysis methods in materials science (Text) |1 https://id.oclc.org/worldcat/entity/E39PCG76xQCKXkM8GDxjtHRmQy |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |z 9783662027691 |
| 830 | 0 | |a Springer series in surface sciences ; |v 23. | |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=3098422 |z Texto completo |
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