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Defects-recognition imaging and physics in semiconductors XIV : selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan /
This volume documents the latest understanding of many topics of current interest in the science and technology of defects in semiconductors. The investigation of defects in semiconductors is a little different to that in other fields of materials science: in order to observe defects in semiconducto...
| Cote: | Libro Electrónico |
|---|---|
| Collectivité auteur: | |
| Autres auteurs: | , |
| Format: | Électronique Actes de congrès eBook |
| Langue: | Inglés |
| Publié: |
Durnten-Zurich ; Enfield, N.H. :
Trans Tech Publications,
©2012.
|
| Collection: | Materials science forum ;
v. 725. |
| Sujets: | |
| Accès en ligne: | Texto completo |
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