Loading…

Semiconductor Strain Metrology : Principles and Applications.

This book surveys the major and newly developed techniques for semiconductor strain metrology. This e-book employs a tutorial approach to explain the principles and applications of each technique specifically tailored for graduate students and postdoctoral researchers.

Bibliographic Details
Call Number:Libro Electrónico
Main Author: Wong, Terence K. S.
Format: Electronic eBook
Language:Inglés
Published: Sharjah : Bentham Science Publishers, 2012.
Subjects:
Online Access:Texto completo
Search Result 1
by Wong, Terence K. S.
Published 2012
Texto completo
Electronic eBook