Semiconductor Strain Metrology : Principles and Applications.
This book surveys the major and newly developed techniques for semiconductor strain metrology. This e-book employs a tutorial approach to explain the principles and applications of each technique specifically tailored for graduate students and postdoctoral researchers.
Call Number: | Libro Electrónico |
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Main Author: | |
Format: | Electronic eBook |
Language: | Inglés |
Published: |
Sharjah :
Bentham Science Publishers,
2012.
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Subjects: | |
Online Access: | Texto completo |
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