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EBOOKCENTRAL_ocn806204694 |
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OCoLC |
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120726s2012 xx o 000 0 eng d |
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|a 966926726
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|a 9781608053599
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|a 1608053598
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|z (OCoLC)966926726
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|a QC611
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082 |
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|a 621.3815
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|a UAMI
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100 |
1 |
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|a Wong, Terence K. S.
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245 |
1 |
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|a Semiconductor Strain Metrology :
|b Principles and Applications.
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260 |
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|a Sharjah :
|b Bentham Science Publishers,
|c 2012.
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300 |
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|a 1 online resource (141 pages)
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336 |
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|a text
|b txt
|2 rdacontent
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337 |
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|a computer
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|2 rdamedia
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|a online resource
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|2 rdacarrier
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588 |
0 |
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|a Print version record.
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|a This book surveys the major and newly developed techniques for semiconductor strain metrology. This e-book employs a tutorial approach to explain the principles and applications of each technique specifically tailored for graduate students and postdoctoral researchers.
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505 |
0 |
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|a 01 Title.pdf; 02 Cover Page; 03 REVISED eBooks End User License Agreement-Website; 04 Dedication; 05 Content; 06 Foreword; 07 Preface; 08 Part 01; 09 Chapter 01; 10 Chapter 02; 11 Part 2; 12 Chapter 03; 13 Chapter 04; 14 Chapter 05; 15 Part 03; 16 Chapter 06; 17 Chapter 07; 18 Chapter 08; 19 Part 04; 20 Chapter 09; 21 Chapter 10; 22 Chapter 11; 23 Conclusion and Outlook; 24 Appendix; 25 Index
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590 |
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|a ProQuest Ebook Central
|b Ebook Central Academic Complete
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650 |
|
0 |
|a Semiconductors
|x Design and construction
|x Materials.
|
650 |
|
0 |
|a Compound semiconductors
|x Design and construction
|x Materials.
|
650 |
|
0 |
|a Silicon-on-insulator technology.
|
650 |
|
6 |
|a Silicium sur isolant.
|
650 |
|
7 |
|a Silicon-on-insulator technology
|2 fast
|
758 |
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|i has work:
|a Semiconductor strain metrology (Text)
|1 https://id.oclc.org/worldcat/entity/E39PCXpTmXtf9yqQJGw74PKQJC
|4 https://id.oclc.org/worldcat/ontology/hasWork
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|i Print version Ý
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856 |
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|u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=976639
|z Texto completo
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938 |
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|a Bentham Science Publisher
|b BENT
|n 9781608053599
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