International Symposium for Testing and Failure Analysis San Jose, Calif, Electronic Device Failure Analysis Society, International Symposium for Testing and Failure Analysis/2011, & ASM International. (2011). ISTFA 2011: Conference proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California. ASM International.
Cita Chicago Style (17a ed.)International Symposium for Testing and Failure Analysis San Jose, Calif, Electronic Device Failure Analysis Society, International Symposium for Testing and Failure Analysis/2011, y ASM International. ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California. Materials Park, OH: ASM International, 2011.
Cita MLA (8a ed.)International Symposium for Testing and Failure Analysis San Jose, Calif, et al. ISTFA 2011: Conference Proceedings from the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California. ASM International, 2011.