Dumin, D. J. (2002). Oxide reliability: A summary of silicon oxide wearout, breakdown, and reliability. World Scientific.
Style de citation Chicago (17e éd.)Dumin, D. J. Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability. [River Edge, NJ]: World Scientific, 2002.
Style de citation MLA (8e éd.)Dumin, D. J. Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability. World Scientific, 2002.
Attention : ces citations peuvent ne pas être correctes à 100%.