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Advanced mathematical & computational tools in metrology & testing VIII /

The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review v...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Authors: AMCTM VIII Paris, France, World Scientific (Firm)
Other Authors: Pavese, Franco
Format: Electronic Conference Proceeding eBook
Language:Inglés
Published: Singapore ; Hackensack, N.J. : World Scientific, ©2009.
Series:Series on advances in mathematics for applied sciences ; v. 78.
Subjects:
Online Access:Texto completo