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ESD : Failure Mechanisms and Models.

Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into...

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Détails bibliographiques
Cote:Libro Electrónico
Auteur principal: Voldman, Dr. Steven H.
Format: Électronique eBook
Langue:Inglés
Publié: Chichester : John Wiley & Sons, 2009.
Sujets:
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