ESD : Failure Mechanisms and Models.

Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Voldman, Dr. Steven H.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Chichester : John Wiley & Sons, 2009.
Temas:
Semiconductors > Failures.
Integrated circuits > Protection.
Integrated circuits > Testing.
Integrated circuits > Reliability.
Electric discharges.
Electrostatics.
Electric action of points.
Semi-conducteurs > Défaillances.
Circuits intégrés > Protection.
Circuits intégrés > Fiabilité.
Décharges électriques.
Electric action of points
Electric discharges
Electrostatics
Integrated circuits > Protection
Integrated circuits > Reliability
Integrated circuits > Testing
Semiconductors > Failures
Acceso en línea:Texto completo
Descripción
Sumario:Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodol.
Descripción Física:1 online resource (410 pages)
ISBN:9780470747261
0470747269

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