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Beam effects, surface topography, and depth profiling in surface analysis /
Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the princi...
| Call Number: | Libro Electrónico |
|---|---|
| Other Authors: | , , |
| Format: | Electronic eBook |
| Language: | Inglés |
| Published: |
New York :
Kluwer Academic,
©2002.
|
| Series: | Methods of surface characterization ;
v. 5. |
| Subjects: | |
| Online Access: | Texto completo |