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Tenth European Powder Diffraction Conference : Geneva, September 1-4, 2006.
Zeitschrift für Kristallographie. Supplement Volume 26 presents the complete Proceedings of all contributions to the X European Powder Diffraction Conference in Geneva 2006: Method Development and Application Instrumental Software Development Materials Supplement Series of Zeitschrift für Kristall...
| Clasificación: | Libro Electrónico |
|---|---|
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Berlin ; Boston :
Oldenbourg Wissenschaftsverlag,
[2015]
|
| Colección: | Zeitschrift für Kristallographie / Supplemente ;
26 |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Frontmatter
- Preface
- Editorial Notes
- European Powder Diffraction Conference Award
- Table of Contents
- Powder diffraction studies on proteins: An overview of data collection approaches
- I. METHOD DEVELOPMENT AND APPLICATION
- I.1 Determination of Crystal Structure
- Nanostructure studied using the atomic pair distribution function
- Likelihood methods with protein powder diffraction data
- The complementary use of solid state NMR and XRD to solve zeolite structures
- Exploiting X-ray induced anisotropic lattice changes to improve intensity extraction in protein powder diffraction: Application to heavy atom detection
- Aspects of validation in the structure determination of organic materials from powder X-ray diffraction data
- Validation of magnetic structures
- I.2 Qualitative and Quantitative Phase Analysis
- New horizons for the structural characterization of stainless steel slags by X-ray powder diffraction
- Method for quick estimation of the Sb3+/Sb5+ content ratio in ATO
- Evaluation of the phase detection limit on filter-deposited dust particles from Antarctic ice cores
- I.3 Analysis of Microstructure and Macrostress
- I.3.1 Residual Stresses
- In-situ investigation by X-ray diffraction and wafer curvature of phase formation and stress evolution during metal thin film
- silicon reactions
- Residual stress profile in ceramic laminates
- I.3.2 Line Broadening Analysis
- Powder diffraction characterization of stacking disorder
- A Debye function based powder diffraction data analysis method
- Illite crystallinity: Instrumental effect and its relation to crystallite size and lattice distortion
- Size-related diffraction anomalies from strongly distorted nano-crystals
- I.4 Texture
- Rietveld texture analysis from diffraction images
- Secondary extinction correction used in a novel method for improved XRD characterizations of textured materials: The case of thin films
- II. INSTRUMENTAL
- In-situ powder diffraction in high magnetic fields
- Characterization of a high performance laboratory parallel-beam diffractometer
- bridging the gap to the synchrotron
- Design of powder diffraction beamline (BL-I11) at Diamond
- In-situ analysis of crystallographic texture using high-energy X-rays
- Installation of the high resolution TOF diffractometer at the Budapest Research Reactor
- Stress and local texture measurements at the materials science diffractometer STRESS-SPEC at FRM-II
- Versatile IBARAKI materials design neutron diffractometer at J-PARC
- From powder diffraction to structure resolution of nanocrystals by precession electron diffraction
- III. SOFTWARE
- Powder pattern indexing and the dichotomy algorithm
- EFLECH/INDEX
- Another try of whole pattern indexing
- Predicted corner-sharing titanium silicates
- Using the Cambridge Structural Database to validate powder structures
- Two-dimensional powder diffraction
- IV.