Chargement en cours…

CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typic...

Description complète

Détails bibliographiques
Cote:Libro Electrónico
Auteur principal: Yuan, Jiann-Shiun (Auteur)
Collectivité auteur: SpringerLink (Online service)
Format: Électronique eBook
Langue:Inglés
Publié: Singapore : Springer Nature Singapore : Imprint: Springer, 2016.
Édition:1st ed. 2016.
Collection:SpringerBriefs in Reliability,
Sujets:
Accès en ligne:Texto Completo