Design, Analysis and Test of Logic Circuits Under Uncertainty

Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs,...

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Détails bibliographiques
Cote:Libro Electrónico
Auteurs principaux: Krishnaswamy, Smita (Auteur), Markov, Igor L. (Auteur), Hayes, John P. (Auteur)
Collectivité auteur: SpringerLink (Online service)
Format: Électronique eBook
Langue:Inglés
Publié: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Édition:1st ed. 2013.
Collection:Lecture Notes in Electrical Engineering, 115
Sujets:
Electronic circuits.
Computer arithmetic and logic units.
Computers.
Logic design.
Computer science-Mathematics.
Electronic Circuits and Systems.
Arithmetic and Logic Structures.
Computer Hardware.
Hardware Performance and Reliability.
Logic Design.
Symbolic and Algebraic Manipulation.
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