Design, Analysis and Test of Logic Circuits Under Uncertainty

Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs,...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Krishnaswamy, Smita (Author), Markov, Igor L. (Author), Hayes, John P. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Series:Lecture Notes in Electrical Engineering, 115
Subjects:
Electronic circuits.
Computer arithmetic and logic units.
Computers.
Logic design.
Computer science-Mathematics.
Electronic Circuits and Systems.
Arithmetic and Logic Structures.
Computer Hardware.
Hardware Performance and Reliability.
Logic Design.
Symbolic and Algebraic Manipulation.
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