Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the c...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Singhee, Amith (Author), Rutenbar, Rob A. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2009.
Edition:1st ed. 2009.
Series:Lecture Notes in Electrical Engineering, 46
Subjects:
Electronic circuits.
Artificial intelligence-Data processing.
Electronic digital computers-Evaluation.
Electronic Circuits and Systems.
Data Science.
System Performance and Evaluation.
Online Access:Texto Completo

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