Test Pattern Generation using Boolean Proof Engines

After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed i...

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Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Drechsler, Rolf (Author), Eggersglüß, Stephan (Author), Fey, Görschwin (Author), Tille, Daniel (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2009.
Edition:1st ed. 2009.
Subjects:
Electronic circuits.
Electronics.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Online Access:Texto Completo

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