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Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling /
This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based mode...
| Cote: | Libro Electrónico |
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| Collectivité auteur: | |
| Autres auteurs: | |
| Format: | Électronique eBook |
| Langue: | Inglés |
| Publié: |
New Delhi :
Springer India : Imprint: Springer,
2016.
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| Édition: | 1st ed. 2016. |
| Collection: | Springer Series in Advanced Microelectronics,
52 |
| Sujets: | |
| Accès en ligne: | Texto Completo |