Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering /

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This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: SpringerLink (Online service)
Other Authors: Yoshida, Yutaka (Editor), Langouche, Guido (Editor)
Format: Electronic eBook
Language:Inglés
Published: Tokyo : Springer Japan : Imprint: Springer, 2015.
Edition:1st ed. 2015.
Series:Lecture Notes in Physics, 916
Subjects:
Semiconductors.
Nanotechnology.
Materials.
Microtechnology.
Microelectromechanical systems.
Condensed matter.
Nanoscience.
Materials Engineering.
Microsystems and MEMS.
Condensed Matter Physics.
Nanophysics.
Online Access:Texto Completo
Description
Summary:This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.
Physical Description:XV, 487 p. 292 illus., 180 illus. in color. online resource.
ISBN:9784431558002
ISSN:1616-6361 ;

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