Ellipsometry of Functional Organic Surfaces and Films

Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces,...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Hinrichs, Karsten (Editor ), Eichhorn, Klaus-Jochen (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Colección:Springer Series in Surface Sciences, 52
Temas:
Surfaces (Physics).
Surfaces (Technology).
Thin films.
Physical chemistry.
Lasers.
Materials-Analysis.
Surface and Interface and Thin Film.
Surfaces, Interfaces and Thin Film.
Physical Chemistry.
Laser.
Characterization and Analytical Technique.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Biomolecules at surfaces
  • Smart polymer surfaces and films
  • Nanostructured surfaces and organic/inorganic hybrids
  • Thin films of organic semiconductors for OPV, OLEDs and OTFT
  • Developments in ellipsometric real-time/in-situ monitoring techniques
  • Infrared brillant light sources for micro-ellipsometric studies of organic films
  • Collection of optical constants of organic layers.

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