Theoretical Concepts of X-Ray Nanoscale Analysis Theory and Applications /

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in d...

Description complète

Détails bibliographiques
Cote:Libro Electrónico
Auteurs principaux: Benediktovich, Andrei (Auteur), Feranchuk, Ilya (Auteur), Ulyanenkov, Alexander (Auteur)
Collectivité auteur: SpringerLink (Online service)
Format: Électronique eBook
Langue:Inglés
Publié: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Édition:1st ed. 2014.
Collection:Springer Series in Materials Science, 183
Sujets:
Measurement.
Measuring instruments.
Materials-Analysis.
Mathematical physics.
Physics.
Spectrum analysis.
Measurement Science and Instrumentation.
Characterization and Analytical Technique.
Theoretical, Mathematical and Computational Physics.
Applied and Technical Physics.
Spectroscopy.
Accès en ligne:Texto Completo
Table des matières:
  • Basic principles of the interaction between X-rays and matter
  • X-ray reflectivity
  • High-resolution X-ray diffraction
  • Grazing-incidence small-angle X-ray scattering
  • Theory of X-ray scattering from imperfect crystals
  • X-ray diffraction for evaluation of residual stresses in polycrystals
  • Methods of mathematical and physical optimization of X-ray data analysis.

Documents similaires