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Hardware and Software: Verification and Testing 7th International Haifa Verification Conference, HVC 2011, Haifa, Israel, December 6-8, 2011, Revised Selected Papers /

This book constitutes the thoroughly refereed post-conference proceedings of the 7th International Haifa Verification Conference, HVC 2011, held in Haifa, Israel in December 2011. The 15 revised full papers presented together with 3 tool papers and 4 posters were carefully reviewed and selected from...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Eder, Kerstin (Editor ), Lourenҫo, João (Editor ), Shehory, Onn (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Programming and Software Engineering, 7261
Temas:
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Preprocessing and Inprocessing Techniques in SAT
  • Pioneering the Future of Verification: A Spiral of Technological and Business Innovation
  • Automated Detection and Repair of Concurrency Bugs
  • Verification Challenges of Workload Optimized Hardware Systems
  • Synthesis with Clairvoyance
  • Generalized Reactivity(1) Synthesis without a Monolithic Strategy
  • IIS-Guided DFS for Efficient Bounded Reachability Analysis of Linear Hybrid Automata
  • Cube and Conquer: Guiding CDCL SAT Solvers by Lookaheads.Implicative Simultaneous Satisfiability and Applications
  • Liveness vs Safety - A Practical Viewpoint
  • Predicting Serializability Violations: SMT-Based Search vs. DPOR-Based Search
  • SAM: Self-adaptive Dynamic Analysis for Multithreaded Programs
  • Concurrent Small Progress Measures
  • Specification and Quantitative Analysis of Probabilistic Cloud Deployment Patterns
  • Interpolation-Based Function Summaries in Bounded Model Checking
  • Can File Level Characteristics Help Identify System Level Fault-Proneness
  • Reverse Coverage Analysis
  • Symbolic Testing of OpenCL Code
  • Dynamic Test Data Generation for Data Intensive Applications
  • Injecting Floating-Point Testing Knowledge into Test Generators
  • Combining Theorem Proving and Symbolic Trajectory Evaluation in THM&STE
  • HAVEN: An Open Framework for FPGA-Accelerated Functional Verification of Hardware
  • On-Line Detection and Prediction of Temporal Patterns
  • Function Summaries in Software Upgrade Checking
  • The Rabin Index of Parity Games
  • Using Computational Biology Methods to Improve Post-silicon Microprocessor Testing.
  • ioneering the Future of Verification: A Spiral of Technological and Business Innovation
  • Automated Detection and Repair of Concurrency Bugs
  • Verification Challenges of Workload Optimized Hardware Systems
  • Synthesis with Clairvoyance
  • Generalized Reactivity(1) Synthesis without a Monolithic Strategy
  • IIS-Guided DFS for Efficient Bounded Reachability Analysis of Linear Hybrid Automata
  • Cube and Conquer: Guiding CDCL SAT Solvers by Lookaheads.Implicative Simultaneous Satisfiability and Applications
  • Liveness vs Safety - A Practical Viewpoint
  • Predicting Serializability Violations: SMT-Based Search vs. DPOR-Based Search
  • SAM: Self-adaptive Dynamic Analysis for Multithreaded Programs
  • Concurrent Small Progress Measures
  • Specification and Quantitative Analysis of Probabilistic Cloud Deployment Patterns
  • Interpolation-Based Function Summaries in Bounded Model Checking
  • Can File Level Characteristics Help Identify System Level Fault-Proneness
  • Reverse Coverage Analysis
  • Symbolic Testing of OpenCL Code
  • Dynamic Test Data Generation for Data Intensive Applications
  • Injecting Floating-Point Testing Knowledge into Test Generators
  • Combining Theorem Proving and Symbolic Trajectory Evaluation in THM&STE
  • HAVEN: An Open Framework for FPGA-Accelerated Functional Verification of Hardware
  • On-Line Detection and Prediction of Temporal Patterns
  • Function Summaries in Software Upgrade Checking
  • The Rabin Index of Parity Games
  • Using Computational Biology Methods to Improve Post-silicon Microprocessor Testing.