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Transmission Electron Microscopy and Diffractometry of Materials
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A ne...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2013.
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| Edición: | 4th ed. 2013. |
| Colección: | Graduate Texts in Physics,
|
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
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| 001 | 978-3-642-29761-8 | ||
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| 100 | 1 | |a Fultz, Brent. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Transmission Electron Microscopy and Diffractometry of Materials |h [electronic resource] / |c by Brent Fultz, James Howe. |
| 250 | |a 4th ed. 2013. | ||
| 264 | 1 | |a Berlin, Heidelberg : |b Springer Berlin Heidelberg : |b Imprint: Springer, |c 2013. | |
| 300 | |a XX, 764 p. |b online resource. | ||
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| 490 | 1 | |a Graduate Texts in Physics, |x 1868-4521 | |
| 505 | 0 | |a Diffraction and X-Ray Powder Diffractometer Problems -- TEM and its Optics Problems -- Neutron Scattering Problems -- Scattering Problems -- Inelastic Electron Scattering and Spectroscopy Problems -- Diffraction from Crystals Sphere Problems -- Electron Diffraction and Crystallography Problems -- Diffraction Contrast in TEM Images Problems -- Diffraction Lineshapes Problems -- Patterson Functions and Diffuse Scattering Problems -- High-Resolution TEM Imaging Problems -- High-Resolution STEM and Related Imaging Techniques Problems -- Dynamical Theory Problems. | |
| 520 | |a This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. | ||
| 650 | 0 | |a Spectrum analysis. | |
| 650 | 0 | |a Materials-Analysis. | |
| 650 | 0 | |a Surfaces (Technology). | |
| 650 | 0 | |a Thin films. | |
| 650 | 0 | |a Surfaces (Physics). | |
| 650 | 1 | 4 | |a Spectroscopy. |
| 650 | 2 | 4 | |a Characterization and Analytical Technique. |
| 650 | 2 | 4 | |a Surfaces, Interfaces and Thin Film. |
| 650 | 2 | 4 | |a Surface and Interface and Thin Film. |
| 700 | 1 | |a Howe, James. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9783642297601 |
| 776 | 0 | 8 | |i Printed edition: |z 9783642297625 |
| 776 | 0 | 8 | |i Printed edition: |z 9783642433153 |
| 830 | 0 | |a Graduate Texts in Physics, |x 1868-4521 | |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/978-3-642-29761-8 |z Texto Completo |
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| 950 | |a Physics and Astronomy (SpringerNature-11651) | ||
| 950 | |a Physics and Astronomy (R0) (SpringerNature-43715) | ||