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Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces /
In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructur...
| Call Number: | Libro Electrónico |
|---|---|
| Corporate Author: | |
| Other Authors: | , |
| Format: | Electronic eBook |
| Language: | Inglés |
| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2012.
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| Edition: | 1st ed. 2012. |
| Series: | Springer Series in Surface Sciences,
48 |
| Subjects: | |
| Online Access: | Texto Completo |